The Caughey-Thomas Mobility Model (E) subnode is available from the context menu (right-click the 
Semiconductor Material Model parent node) or from the 
Physics toolbar, 
Attributes menu. It adds a high field correction to an existing mobility model. The ‘E’ in brackets indicates the model includes high field effects only. It accepts input mobilities of type L, I, C, or S as well as user-defined input mobilities. The set of equations defining the Caughey-Thomas mobility model is shown in the 
Equation section.
 
    For User defined, enter the electron and hole driving forces 
Fn and 
Fp (SI unit: V/m, default is 0).
 
    The Electron input mobility μn,in (SI unit: m
2/(V
⋅s)) parameter is used to define the input mobility to which high field velocity saturation is added. The default is 
User defined for silicon at equilibrium, 1448 cm
2/(V
⋅s).
 
    The Hole input mobility μp,in (SI unit: m
2/(V
⋅s)) defines the input mobility to which high field velocity saturation is added. The default is 
User defined for silicon at equilibrium, 473 cm
2/(V
⋅s).
 
    The default Reference temperature Tref (SI unit: K) is taken 
From material. For 
User defined enter a different value in the text field. The default is 300 K.
 
    The default for each of the following is taken From material. For 
User defined enter a different value in the text field.